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Fault diagnosis for linear analog circuits

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4 Author(s)
Jun-Weir Lin ; Dept. of Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan ; Chung-Len Lee, ; Chau-Chin Su ; Jwu-E Chen

This paper presents a novel scheme to diagnose single and double faults for linear analog circuits. The scheme first proposes a simple transformation procedure to transform the tested linear analog circuit into a discrete signal flow graph, then constructs “diagnosing evaluators”, which model the faulty components, to form a diagnosis configuration to diagnose the faults through digital simulation. This saves much computation time. Furthermore, a simple method to un-power the OP's is also proposed to differentiate equivalent faults. The scheme can diagnose faults in passive components as well as faults in OP's

Published in:

Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian

Date of Conference:

2000