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On the application of artificial neural networks to fault diagnosis in analog circuits with tolerances

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2 Author(s)
Deng Ying ; Coll. of Electr. & Inf. Eng., Hunan Univ., Changsha, China ; He Yigang

This paper proposes a method for analog fault diagnosis by adopting neural networks. The primary focus of the paper is to provide robust diagnosis using a mechanism to deal with the problem of component tolerances and to reduce the testing time. The proposed approach is based on the k-fault diagnosis method and artificial backward propagation neural network, which is shown to be capable of robust diagnosis of analog circuits with tolerances

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Signal Processing Proceedings, 2000. WCCC-ICSP 2000. 5th International Conference on  (Volume:3 )

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