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Why nanovoltmeter offset currents do not explain measured deviations in the quantized Hall resistance

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2 Author(s)
Inglis, D. ; Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada ; Wood, B.

T.P. Chen and H.A. Chua [ibid. vol. 47, pp. 592-594, 1998] have suggested that deviations in the value of resistance in QHR devices with resistive contacts may be attributable to the offset (or bias) current of the nanovoltmeter used to measure the QHR devices. We present two reasons why their explanation is unreasonable.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:49 ,  Issue: 6 )

Date of Publication:

Dec. 2000

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