Cart (Loading....) | Create Account
Close category search window
 

Comments on "Evanescent microwaves: a novel super-resolution noncontact nondestructive imaging technique for biological applications" [with reply]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kumar, A. ; AK Electromagn. Inc., Dollard-des-Ormeaux, Que., Canada ; Tabib-Azar, M.

Evanescent microwave principles of operation are based on the papers described by Kumar and Smith [1976] and Kumar [1976]. They described that when a dielectric/semiconductor/biological material is placed in the vicinity of the evanescent waveguide (which is connected to a cavity resonator), the reflection coefficient of the resonator changes. Both the resonance frequency and the quality factor of the cavity resonator are affected by the presence of the material. The amount of change in the resonance depends primarily on the microwave properties of the sample as well as on the distance between the wall (resonator iris to the evanescent waveguide) and the sample, and the effective area of sample in the waveguide. It was also shown that microwave properties of a material are a function of permittivity and permeability. The authors of the above paper have used the same principle, where a microstrip type resonator and an evanescent probe have been used instead of a waveguide resonator and an evanescent waveguide. Therefore, they should have referenced the original papers in their article.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:49 ,  Issue: 6 )

Date of Publication:

Dec. 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.