Cart (Loading....) | Create Account
Close category search window

EMI-noise analysis under ASIC design environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hayashi, S. ; Syst. LSI Design Div., Toshiba Corp., Kawasaki, Japan ; Yamada, M.

Electromagnetic compatibility (EMC) has become more and more important in designing electronic systems. Although electromagnetic radiation itself mainly occurs from off-chip conductors, the ultimate noise source is in LSI chips. Among the noise distribution paths, the power-line conducting noise is the most significant source of electromagnetic interference (EMI)-noise caused by LSIs. This paper introduces an EMI-noise analysis method suitable for application-specific integrated circuit design environment especially focusing on the power-line conducting noise. Modeling method for power network and switching activity, simulation flow, and experimental results are presented. Experimental results show that our modeling methodology estimates capacitance values with sufficient accuracy and reproduces the relative differences in EMI-noise levels

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:19 ,  Issue: 11 )

Date of Publication:

Nov 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.