By Topic

The postprocessing resolution required for accurate RF coverage validation and prediction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bernardin, P. ; Nortel Network, Richardson, TX, USA ; Manoj, K.

With the trend of cellular providers shifting to higher frequencies, there is an increasing migration to smaller cells that is further driven by the growing demand for wireless Internet services. This obviously calls for higher resolution RF validation and prediction. Yet, to our knowledge, there has been no study as to what resolution is required for accurate RF modeling and prediction. Many of today's computer prediction tools can provide estimates of RF signal strength at arbitrary spatial resolution. However, the choice of this resolution is often left up to the discretion of the user. Even worse, sometimes the prediction resolution is hard-coded to be the same as that of the terrain database. Choosing a resolution bin size that is too small is both computationally inefficient and unnecessarily wasteful of valuable memory resources. Choosing a resolution bin size that is too coarse introduces ubiquitous uncertainty about the quality of RF coverage. This paper investigates the spatial quantization noise requirements of RF prediction and RF coverage validation. It is found that the minimum resolution bin size required to mitigate spatial quantization noise effects is about one-fortieth of the cell radius

Published in:

Vehicular Technology, IEEE Transactions on  (Volume:49 ,  Issue: 5 )