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Fabrication of depletion-mode GaAs MOSFET with a selective oxidation process by using metal as the mask

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4 Author(s)
Wu, Jau-Yi ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Wang, Hwei-Heng ; Yeong-Her Wang ; Mau-Phon Houng

The n-channel depletion-mode GaAs MOSFETs with a selective liquid phase chemical-enhanced oxidation method at low temperature by using metal as the mask (M-SLPCEO) are demonstrated. The proposed process can simplify one mask to fabricate GaAs MOSFET and grow reliable gate oxide films as well as side-wall passivation layers at the same time. The 1 /spl mu/m gate-length MOSFET with a gate oxide thickness of 35 nm shows a transconductance of 90 mS/mm and a maximum drain current density larger than 350 mA/mm. In addition, a short-circuit current gain cutoff frequency f/sub T/ of 6.5 GHz and a maximum oscillation frequency f/sub max/ of 18.3 GHz have been achieved from the 1 /spl mu/m/spl times/100 /spl mu/m GaAs MOSFET.

Published in:
Electron Device Letters, IEEE  (Volume:22 ,  Issue: 1 )

Date of Publication: Jan. 2001

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