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Optimizing the performance of ESD circuit protection devices

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4 Author(s)
Hyatt, H. ; Littelfuse Inc., Des Plaines, IL, USA ; Harris, J. ; Colby, J. ; Bellew, P.

Decision-making methods for choosing ESD circuit protection remain poorly understood. Selecting an IC which passed ESD device level testing does not guarantee that a particular circuit using that device will survive ESD events. We present an optimization methodology for assessment of ESD circuit protection.

Published in:

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000

Date of Conference:

26-28 Sept. 2000

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