Cart (Loading....) | Create Account
Close category search window
 

An adaptive contour closure algorithm and its experimental evaluation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Jiang, X. ; Dept. of Comput. Sci., Bern Univ., Switzerland

The potential of edge-based complete image segmentation into regions has not gained the due attention in the literature thus far. The present paper attempts to explore this potential by proposing an adaptive grouping algorithm to solve the contour closure problem that is the key to a successful edge-based complete image segmentation. The effectiveness of the proposed algorithm is extensively tested in the range image domain and compared to several region-based segmentation methods within a rigorous comparison framework. On three range image databases of varying quality acquired by different range scanners, it is shown that the proposed approach is able to achieve very appealing performance with respect to both segmentation quality and computation time.

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:22 ,  Issue: 11 )

Date of Publication:

Nov 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.