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Low-power technique of scan-based design for test

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3 Author(s)
Lei Xu ; Inst. of Microelectron., Tsinghua Univ., Beijing, China ; Yihe Sun ; Hongyi Chen

Details of an advanced scan tree structure for test power reduction, and the novel approach of rate of bit propagation which is used to estimate power consumption, are presented. Test power consumptions for advanced scan tree and traditional scan chains are compared

Published in:

Electronics Letters  (Volume:36 ,  Issue: 23 )