By Topic

Directional line detectors in correlated noisy environments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
J. F. Y. Cheung ; Dept. of Electr. Eng., New York Inst. of Technol., NY, USA ; H. Heskiaoff ; S. H. Billis ; P. S. Cheng

In this research, we present a methodology for extracting very narrow lines in correlated noisy environments. The approach is a generalization of the analysis of variance applied to the symmetrically balanced incomplete-blocks design. It encompasses many well-known algorithms when subjected to more restrictive conditions. The detector is robust and superior to the polynomial-approximation-based detector and the classical Prewitt detector. The procedure detects narrow lines embedded in nonuniform background without compromising resolution, and performs satisfactorily in severe corruptive noise. Extensive computer simulations demonstrate the practicality of the detector on real imaging environments (fingerprints).

Published in:

IEEE Transactions on Image Processing  (Volume:9 ,  Issue: 12 )