Cart (Loading....) | Create Account
Close category search window

A Y-fed directional coupler modulator with a highly linear transfer curve

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kishino, T. ; Florida Univ., Gainesville, FL, USA ; Tavlykaev, R.F. ; Ramaswamy, R.V.

We demonstrated a linearized Y-fed directional coupler modulator in Z-cut LiNbO/sub 3/. The proof-of-concept device employed two electrode sections of opposite polarity whose lengths were chosen based on the results of our previous theoretical modeling. A highly linear modulation characteristic and improved tolerance to fabrication errors were achieved with a simple design, in excellent agreement with the theory. The linearity exceeded 90% over a wavelength range of 45 nm, centered around 1530 nm, with a maximum linearity of 97% at 1510 nm and a maximum modulation depth of 98%. By comparison, the linearity of conventional modulators is typically around 70%. Thus the device was proven to have a high linearity with a wide usable spectral range and relaxed fabrication tolerances.

Published in:

Photonics Technology Letters, IEEE  (Volume:12 ,  Issue: 11 )

Date of Publication:

Nov. 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.