Cart (Loading....) | Create Account
Close category search window
 

Exploring dynamic Bayesian belief networks for intelligent fault management systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sterritt, R. ; Ulster Univ., Jordanstown, UK ; Marshall, A.H. ; Shapcott, C.M. ; McClean, S.I.

Systems that are subject to uncertainty in their behaviour are often modelled by Bayesian belief networks (BBNs). These are probabilistic models of the system in which the independence relations between the variables of interest are represented explicitly. A directed graph is used, in which two nodes are connected by an edge if one is a `direct cause' of the other. However the Bayesian paradigm does not provide any direct means for modelling dynamic systems. There has been a considerable amount of research effort in recent years to address this. We review these approaches and propose a new dynamic extension to the BBN. Our discussion then focuses on fault management of complex telecommunications and how the dynamic Bayesian models can assist in the prediction of faults

Published in:

Systems, Man, and Cybernetics, 2000 IEEE International Conference on  (Volume:5 )

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.