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Next generation functional test program development system

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2 Author(s)
D. Rolince ; Teradyne Inc., North Reading, MA, USA ; D. Giles

While superior-quality functional board test has been a goal for most high reliability electronics manufacturers, the time and effort for generating such test programs using today's tools and processes makes this difficult to achieve in a cost effective manner. This paper will introduce a revolutionary approach to functional board test program development that combines the comprehensiveness of software-based simulation with the speed and simplicity of hardware emulation. The result is a functional Test Program Set development system that can produce high fault coverage, diagnostic test programs in a fraction of the time it takes using traditional techniques, and at a lower unit cost. In this paper we will first provide a brief background on the strengths and weaknesses of current software and hardware TPS development techniques-simulation hot mock-up. Next, the new approach is described in detail and contrasted against the existing techniques. Finally, we present actual experience to date using a prototyped system

Published in:

AUTOTESTCON Proceedings, 2000 IEEE

Date of Conference: