Close category search window
 

Detection of water trees in medium voltage XLPE cables by return voltage measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Jonuz, B. ; Delft Univ. of Technol., Netherlands ; Morshuis, P.H.F. ; van Breen, H.J. ; Pellis, J.
more authors

Several methods are proposed in literature to characterize the state of deterioration of water-treed cable insulation. One of these methods is the return voltage measurement (RVM) method, which was initially introduced as a diagnostic method for oil-paper insulating systems. It is mostly used to determine the condition of the paper insulation of transformer windings. It has been shown that it is possible to use RVM for detection of water trees in XLPE cables. In this paper, a methodology is presented that allows the detection of water trees in PE and XLPE insulated cables, without the need for a reference measurement. Also, the influence of temperature on RVM measurements was examined, for cables with and without water trees

Published in:
Electrical Insulation and Dielectric Phenomena, 2000 Annual Report Conference on  (Volume:1 )

Date of Conference: 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.