Cart (Loading....) | Create Account
Close category search window

On the completeness of test cases for atomic arithmetic expressions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Tse, T.H. ; Hong Kong Univ., China ; Chen, T.Y. ; Feng, X.

Most research on weak mutation testing focuses on predicate statements. Relative little attention has been paid to arithmetic expressions. In this paper we analyse the latter type of expression and prove that, given an atomic arithmetic expression, if it contains no variable or if the operator is the unary “++” or “--”, then a single test case is sufficient and necessary to kill any fundamental mutant; otherwise, two test cases are sufficient and necessary

Published in:

Quality Software, 2000. Proceedings. First Asia-Pacific Conference on

Date of Conference:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.