Cart (Loading....) | Create Account
Close category search window
 

A framework for quantifying error proneness in software

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Sitte, R. ; Sch. of Inf. Technol., Griffith Univ., Brisbane, Qld., Australia

This paper proposes a framework for assessing quantitatively the error-proneness of computer program modules. The model uses an information theory approach to derive an error proneness index, that can be used in a practical way. Debugging and testing rake at least 40% of a software project's effort, but do not uncover all defects. While current research looks at identifying problem-modules in a program, no attempt is made for a quantitative error-proneness evaluation. By quantitatively assessing a module's susceptibility to error, we are able to identify error prone paths in a program and enhance testing efficiency. The goal is to identify error prone paths in a program using genetic algorithms. This increases software reliability, aids in testing design, and reduces software development cost

Published in:

Quality Software, 2000. Proceedings. First Asia-Pacific Conference on

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.