Cart (Loading....) | Create Account
Close category search window
 

Matched filter bounds on q-ary QAM symbol error probability for diversity receptions and multipath fading ISI channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Heung-No Lee ; Dept. of Network Analysis & Syst., HRL Labs., Malibu, CA, USA ; Pottie, G.J.

This paper extends previous works in matched filter bounds and provides a theoretical calculation of detection probability of q-ary QAM signals transmitted over the diversity reception and multipath fading ISI channels. The matched filter bounds represent the best attainable detection performance of a particular system, which may or may not be realized with a practical system. While an exact analytical expression of detection performance of a transceiver system is difficult to obtain for multipath fading ISI channels, the matched filter bounds are relatively easy to obtain, provide much useful information, and give a good comparison with the simulation results of realistic systems

Published in:

Personal, Indoor and Mobile Radio Communications, 2000. PIMRC 2000. The 11th IEEE International Symposium on  (Volume:1 )

Date of Conference:

2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.