Cart (Loading....) | Create Account
Close category search window

A framework for robustness analysis of constrained finite receding horizon control

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Primbs, James A. ; Dept. of Control & Dynamical Syst., California Inst. of Technol., Pasadena, CA, USA ; Nevistic, V.

A framework for robustness analysis of input-constrained finite receding horizon control is presented. Under the assumption of quadratic upper bounds on the finite horizon costs, we derive sufficient conditions for robust stability of the standard discrete-time linear-quadratic receding horizon control formulation. This is achieved by recasting conditions for nominal and robust stability as an implication between quadratic forms, lending itself to S-procedure tools which are used to convert robustness questions to tractable convex conditions. Robustness with respect to plant/model mismatch as well as for state measurement error is shown to reduce to the feasibility of linear matrix inequalities. Simple examples demonstrate the approach.

Published in:

Automatic Control, IEEE Transactions on  (Volume:45 ,  Issue: 10 )

Date of Publication:

Oct. 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.