By Topic

Analysis of the linewidth of a grating-feedback GaAlAs laser

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
G. Genty ; Metrol. Res. Inst., Helsinki Univ. of Technol., Espoo, Finland ; A. Grohn ; H. Talvitie ; M. Kaivola
more authors

Effects of external optical feedback from a reflection grating on the linewidth of a GaAlAs semiconductor laser operating at 780 nm are investigated. Accurate linewidth measurements as a function of the laser frequency tuning have been performed by applying the self-homodyne technique with a short delay line. A realistic coupled-cavity model, which incorporates the frequency-dependent reflection from the grating, is used to explain the measured data. The agreement between the theoretical and experimental results was found to be good.

Published in:

IEEE Journal of Quantum Electronics  (Volume:36 ,  Issue: 10 )