Cart (Loading....) | Create Account
Close category search window

Inductive fault analysis revisited [integrated circuits]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Corsi, F. ; Dipartimento di Elettrotecnica ed Elettronica, Bari Univ.

The principles of inductive fault analysis (IFA), a technique for the determination of a list of the possible faults in an integrated circuit, ranked according to their probability of occurrence, are reviewed and criticised. It is pointed out that IFA should be upgraded to achieve reasonable flexibility in dealing with different MOS technologies and that the Monte Carlo approach, used for determination of fault probabilities, cannot practically provide reliable fault ranking. A possible approach to more algorithmic and less technology-dependent IFA and an alternative to the Monte Carlo method for evaluation of fault probabilities are discussed, together with a simple application example

Published in:

Circuits, Devices and Systems, IEE Proceedings G  (Volume:138 ,  Issue: 2 )

Date of Publication:

Apr 1991

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.