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Voltage dependent gate capacitance and its impact in estimating power and delay of CMOS digital circuits with low supply voltage

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3 Author(s)
Nose, K. ; Inst. of Ind. Sci., Tokyo Univ., Japan ; Soo-Ik Chae ; Sakurai, T.

Gate capacitance has complex voltage dependency on terminal voltages but the impact of this voltage dependency of gate capacitance on power and delay has not been fully investigated, especially, in low-voltage, low-power designs. Introducing an effective gate capacitance, CG,eff it is shown that the power and delay of CMOS digital circuit can be estimated accurately. CG,eff is a strong function of VTH/VDD and VTH/VDD tends to increase in low-voltage region. Hence, the effective capacitance relative to oxide capacitance, COX, is decreasing in low-voltage, low-power designs. Therefore, considering CG,eff in accurate power and delay estimation becomes more important in the future.

Published in:

Low Power Electronics and Design, 2000. ISLPED '00. Proceedings of the 2000 International Symposium on

Date of Conference:

2000

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