Cart (Loading....) | Create Account
Close category search window
 

Analysis of transient electromagnetic scattering from closed surfaces using a combined field integral equation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Shanker, B. ; Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA ; Ergin, A.A. ; Aygun, K. ; Michielssen, E.

In the past, both the time-domain electric and magnetic field integral equations have been applied to the analysis of transient scattering from closed structures. Unfortunately, the solutions to both these equations are often corrupted by the presence of spurious interior cavity modes. In this article, a time-domain combined field integral equation is derived and shown to offer solutions devoid of any resonant components. It is anticipated that stable marching-on-in-time schemes for solving this combined field integral equation supplemented by fast transient evaluation schemes such as the plane wave time-domain algorithm will enable the analysis of scattering from electrically large closed bodies capable of supporting resonant modes

Published in:

Antennas and Propagation, IEEE Transactions on  (Volume:48 ,  Issue: 7 )

Date of Publication:

Jul 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.