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Specification-driven test generation for analog circuits

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2 Author(s)
Variyam, P.N. ; Texas Instrum. Inc., Dallas, TX, USA ; Chatterjee, A.

In this paper, a new methodology for generating transient tests to detect faults in analog circuits is presented. Relationship between circuit functionalities and physical failures is exploited to derive these tests. These fast transient tests can be used for implicitly verifying the circuit specifications. A fast fault simulation algorithm for linear analog circuits based on state-space representation and adjoint network method is also presented. This fault simulation algorithm is used for generating transient test for linear analog circuits. For nonlinear circuits, an existing circuit simulator is used for test generation. The generated tests are evaluated and found to give low misclassification rates for a large class of analog circuits

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Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:19 ,  Issue: 10 )