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A method for trading off test time, area and fault coverage in datapath BIST synthesis

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3 Author(s)
Berthelot, D. ; Lab. d''Inf., Univ. des Sci. et Tech. du Languedoc, Montpellier, France ; Flottes, M.L. ; Rouzeyre, B.

This paper presents a method for deriving a BIST specification from the initial specification of datapaths. This method minimizes BIST area overhead under test time constraint while guaranteeing a user chosen fault coverage. The designer can thus explore a wide range of solutions and keep the one that best fits with design constraints. Results show great improvements over lower level techniques

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Test Workshop, 2000. Proceedings. IEEE European

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