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Accurate determination of the ordinary index profile of proton-exchanged waveguides

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4 Author(s)
M. Marangoni ; Ist. Nazionale Fisica della Mater., CNR, Milano, Italy ; R. Ramponi ; R. Osellame ; V. Russo

A new method for an accurate characterization of the ordinary refractive index profile of proton-exchanged waveguides is presented and discussed. The method is based on the measurement of the power coupled into radiation modes of the waveguide as a function of the corresponding effective indexes, and allows the determination of the depth and of the film refractive index of the ordinary profile by a least squares fitting of the experimental points. The depth and the film refractive index have been experimentally obtained with an accuracy of 0.005 /spl mu/m and 0.0001, respectively.

Published in:

Journal of Lightwave Technology  (Volume:18 ,  Issue: 9 )