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Accurate determination of the ordinary index profile of proton-exchanged waveguides

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4 Author(s)
Marangoni, M. ; Ist. Nazionale Fisica della Mater., CNR, Milano, Italy ; Ramponi, R. ; Osellame, R. ; Russo, V.

A new method for an accurate characterization of the ordinary refractive index profile of proton-exchanged waveguides is presented and discussed. The method is based on the measurement of the power coupled into radiation modes of the waveguide as a function of the corresponding effective indexes, and allows the determination of the depth and of the film refractive index of the ordinary profile by a least squares fitting of the experimental points. The depth and the film refractive index have been experimentally obtained with an accuracy of 0.005 /spl mu/m and 0.0001, respectively.

Published in:

Lightwave Technology, Journal of  (Volume:18 ,  Issue: 9 )

Date of Publication:

Sept. 2000

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