By Topic

Error analysis in surface transfer impedance measurements on shielded cables

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
K. N. Sakthivel ; Centre for Electromagn., SAMEER, Chennai, India ; S. K. Das ; R. Ganesan

This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.

Published in:

Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on

Date of Conference:

6-8 Dec. 1999