Close category search window
 

Comparative analysis of different implementations of multiple-input signature analyzers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Maxwell, P.C. ; Dept. of Comput. Sci., New South Wales Univ., Sydney, NSW, Australia

Signature analysis is an accepted method of obtaining data compression for built-in testing applications. The author deals with a unified approach to the analysis of multiple-input signature analyzers by considering them as finite state switching circuits. This approach is used to investigate and compare different implementations, and it is shown that there is a large range of alternatives to achieve a given characteristic polynomial. Particular emphasis is placed on the two most common implementations. It is shown that both perform polynomial division, with each input of one circuit being equivalent to a combination of inputs of the other. The approach also gives a method of expressing aliasing patterns for both implementations, which leads to a study of the differences with regard to certain error detection capabilities

Published in:
Computers, IEEE Transactions on  (Volume:37 ,  Issue: 11 )

Date of Publication: Nov 1988

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.