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Corroborating cutoff frequency measurements with DC gain measurements

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1 Author(s)
K. A. Jenkins ; IBM Thomas, J. Watson Res. Center, Yorktown Heights, NY, USA

A test for the correct measurement of the cutoff frequency of bipolar transistors is described. The method tests the equality of the low frequency, small signal, current gain measured by a network analyzer, and by DC current measurements. The method is described, and sample data are shown to demonstrate its practical application

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:40 ,  Issue: 3 )