By Topic

Tolerating multiple faults in multistage interconnection networks with minimal extra stages

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Fan, C.C. ; Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA ; Bruck, J.

Adams and Siegel (1982) proposed an extra stage cube interconnection network that tolerates one switch failure with one extra stage. We extend their results and discover a class of extra stage interconnection networks that tolerate multiple switch failures with a minimal number of extra stages. Adopting the same fault model as Adams and Siegel, the faulty switches can be bypassed by a pair of demultiplexer/multiplexer combinations. It is easy to show that, to maintain point to point and broadcast connectivities, there must be at least S extra stages to tolerate I switch failures. We present the first known construction of an extra stage interconnection network that meets this lower-bound. This 12-dimensional multistage interconnection network has n+f stages and tolerates I switch failures. An n-bit label called mask is used for each stage that indicates the bit differences between the two inputs coming into a common switch. We designed the fault-tolerant construction such that it repeatedly uses the singleton basis of the n-dimensional vector space as the stage mask vectors. This construction is further generalized and we prove that an n-dimensional multistage interconnection network is optimally fault-tolerant if and only if the mask vectors of every n consecutive stages span the n-dimensional vector space

Published in:

Computers, IEEE Transactions on  (Volume:49 ,  Issue: 9 )