Cart (Loading....) | Create Account
Close category search window

Trigger inheritance and overriding in an active object database system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bertino, E. ; Dipartimento di Sci. dell''Inf., Milan Univ., Italy ; Guerrini, G. ; Merlo, I.

An active database is a database in which some operations are automatically executed when specified events happen and particular conditions are met. Several systems supporting active rules in an object oriented data model have been proposed. However, several issues related to the integration of triggers with object oriented modeling concepts have not been satisfactorily addressed. We discuss issues related to trigger inheritance and refinement in the context of the Chimera active object oriented data model. In particular, we introduce a semantics for an active object language that takes into account trigger inheritance and supports trigger overriding. Moreover, we state conditions on trigger overriding ensuring that trigger semantics is preserved in subclasses

Published in:

Knowledge and Data Engineering, IEEE Transactions on  (Volume:12 ,  Issue: 4 )

Date of Publication:

Jul/Aug 2000

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.