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A technique for fast transient statistical simulation of analog circuits

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2 Author(s)
Lopez-Ahumada, R. ; Escuela Politecnica Superior, Huelva Univ., Spain ; Rodriguez-Macias, R.

A technique is presented to evaluate mean values and standard deviations of transient analog cell specifications under random fluctuations of the primitive component parameters. Its precision and generality are similar to those of Monte Carlo analysis of electrical simulations while its CPU time is considerably smaller. The advantages of the proposed technique are demonstrated via the statistical evaluation of two CMOS cells

Published in:

Circuits and Systems, 1999. 42nd Midwest Symposium on  (Volume:1 )

Date of Conference:

1999