Cart (Loading....) | Create Account
Close category search window
 

Fitting superellipses

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Rosin, P.L. ; Dept. of Comput. Sci., Cardiff Univ., UK

In the literature, methods for fitting superellipses to data tend to be computationally expensive due to the nonlinear nature of the problem. This paper describes and tests several fitting techniques which provide different trade-offs between efficiency and accuracy. In addition, we describe various alternative error of fit measures that can be applied by most superellipse fitting methods

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:22 ,  Issue: 7 )

Date of Publication:

Jul 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.