Referenced Items are not available for this document.
This paper describes an approach for the computer diagnosis and tuning of microwave filters relying upon model-based parameter estimation and multi-level optimization. This approach uses the reduced-order system and the effect of measurement noise is also considered. This approach can be applied to many classes of the filters. Examples are presented to demonstrate its feasibility.
Published in:
Microwave Symposium Digest. 2000 IEEE MTT-S International
(Volume:3
)
Date of Conference: 11-16 June 2000
- Page(s):
- 1641 - 1644 vol.3
- Meeting Date :
- 11 Jun 2000-16 Jun 2000
- ISSN :
- 0149-645X
- Print ISBN:
- 0-7803-5687-X
- INSPEC Accession Number:
- 6703889
- Conference Location :
- Boston, MA, USA
- Digital Object Identifier :
- 10.1109/MWSYM.2000.862292
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
