Novel electromagnetic field probe using electro/magneto-optical crystals mounted on optical fiber facets for microwave circuit diagnosis

We propose a new class of electromagnetic field probing scheme for microwave planar circuit diagnosis. The measurement principle is based on electro-optic/magneto-optic crystals mounted on optical fiber facets. Combining those fiber edge probes with a CW semiconductor laser source, a fast photodetector and an RF spectrum analyzer, electromagnetic field intensity on a microstrip transmission line has been measured in the frequency domain, where voltage and current amplitudes have been independently investigated with sensitivities of 30 mV and 0.6 mA, respectively.