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Novel electromagnetic field probe using electro/magneto-optical crystals mounted on optical fiber facets for microwave circuit diagnosis

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6 Author(s)
S. Wakana ; Dept. of Electron. Eng., Tokyo Univ., Japan ; T. Ohara ; M. Abe ; E. Yamazaki
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We propose a new class of electromagnetic field probing scheme for microwave planar circuit diagnosis. The measurement principle is based on electro-optic/magneto-optic crystals mounted on optical fiber facets. Combining those fiber edge probes with a CW semiconductor laser source, a fast photodetector and an RF spectrum analyzer, electromagnetic field intensity on a microstrip transmission line has been measured in the frequency domain, where voltage and current amplitudes have been independently investigated with sensitivities of 30 mV and 0.6 mA, respectively.

Published in:

Microwave Symposium Digest. 2000 IEEE MTT-S International  (Volume:3 )

Date of Conference:

11-16 June 2000