By Topic

Fault-tolerant processor arrays based on the 1½-track switches with flexible spare distributions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Horita, T. ; Fac. of Eng., Iwate Univ., Morioka, Japan ; Takanami, I.

A mesh-connected processor array consists of many similar processing elements (PEs) which can be executed in both parallel and pipeline processing. For the implementation of an array of large numbers of processors, some fault-tolerant issues are necessary to enhance the (fabrication-time) yield and the (run-time) reliability. In this paper, we propose a fault-tolerant reconfigurable processor array using single-track switches like Kung et al.'s model. The reconfiguration process in our model is executed based on the concept of the “compensation path” like Kung et al.'s method, too. In our model, spare PEs are not necessarily put around the array, but are more flexibly put in the array by changing connections between spare PEs and nonspare PEs while retaining the connections among nonspare PEs in the same manner in Kung et al.'s model. The proposed model has such a desirable property that physical distances between logically adjacent PEs in the reconfigured array are within a constant, that is, independent of sizes of arrays. We show that the hardware overhead of the proposed model is a little greater than that of Kung et al.'s model, while the yield of the proposed model is much better than that of Kung et al.'s model

Published in:

Computers, IEEE Transactions on  (Volume:49 ,  Issue: 6 )