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Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

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3 Author(s)
Bruce, S ; Signals & Syst., Uppsala Univ., Sweden ; Vandamme, L.K.J. ; Rydberg, A.

A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers

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Electron Devices, IEEE Transactions on  (Volume:47 ,  Issue: 9 )