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The I test: an improved dependence test for automatic parallelization and vectorization

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3 Author(s)
Kong, X. ; Sun Microsyst., Mountain View, CA, USA ; Klappholz, D. ; Psarris, K.

The I test is a subscript dependence test which extends both the range of applicability and the accuracy of the GCD and Banerjee tests (U. Banerjee, 1976), standard subscript dependence tests used to determine whether loops may be parallelized/vectorized. It is shown that the I test is useful when, in the event that a positive result must be reported, a definitive positive is of more use than a tentative positive and when insufficient loop iterations are known for the Banerjee test to apply

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Parallel and Distributed Systems, IEEE Transactions on  (Volume:2 ,  Issue: 3 )