By Topic

The I test: an improved dependence test for automatic parallelization and vectorization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kong, X. ; Sun Microsyst., Mountain View, CA, USA ; Klappholz, D. ; Psarris, K.

The I test is a subscript dependence test which extends both the range of applicability and the accuracy of the GCD and Banerjee tests (U. Banerjee, 1976), standard subscript dependence tests used to determine whether loops may be parallelized/vectorized. It is shown that the I test is useful when, in the event that a positive result must be reported, a definitive positive is of more use than a tentative positive and when insufficient loop iterations are known for the Banerjee test to apply

Published in:

Parallel and Distributed Systems, IEEE Transactions on  (Volume:2 ,  Issue: 3 )