By Topic

Modeling and estimation of the spatial distribution of elevation error in high resolution DEMs from stereo-image processing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
C. H. Davis ; Dept. of Electr. Eng., Missouri Univ., Columbia, MO, USA ; H. Jiang ; Xiangyun Wang

The authors examine the spatial variability of elevation error in high-resolution DEMs derived from stereo-image processing. DEM error models are developed by examining the correlation between various parameters and the observed DEM error. The DEM vertical errors are obtained from a database containing more than 51,000 points of known elevation. The error models are shown to have strong correlation with the magnitude of the random DEM vertical error. In addition, the models capture the full dynamic range of the observed error and are able to predict the overall error in four different high-resolution DEMs to within ±5%. Moreover, the final model is used to estimate the vertical error at every point in a DEM containing ~20 million elevations

Published in:

Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International  (Volume:7 )

Date of Conference: