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Use of commercial VDMOSFETs in electronic systems subjected to radiation

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7 Author(s)
Picard, C. ; LETI, CEA, Centre d''Etudes Nucleaires de Saclay, Gif-sur-Yvette, France ; Brisset, C. ; Quittard, O. ; Marceau, M.
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This study explores the effectiveness of pre-irradiation as a hardening technique for COTS components used in electronic power systems. This technique greatly improves the radiation tolerance of VDMOSFETs in such systems, whereby a small change in Rdson is observed

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Nuclear Science, IEEE Transactions on  (Volume:47 ,  Issue: 3 )