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Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

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6 Author(s)
McMorrow, D. ; Naval Res. Lab., Washington, DC, USA ; Melinger, J.S. ; Buchner, S. ; Scott, T.
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Pulsed laser single-event upset tests are used to pinpoint and characterize sensitive nodes of circuits and to provide feedback relevant to the development and optimization of radiation-hard designs. The results presented reveal the advantages of incorporating laser evaluation at an early stage into programs described for the development of radiation-hardened parts. A quantitative correlation is observed between the laser single-event upset and single-event latchup threshold measurements and those performed using accelerator-based heavy ion testing methods

Published in:

Nuclear Science, IEEE Transactions on  (Volume:47 ,  Issue: 3 )

Date of Publication:

Jun 2000

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