By Topic

Efficient object-oriented integration and regression testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Y. Le Traon ; IRISA, Rennes, France ; T. Jeron ; J. -M. Jezequel ; P. Morel

This paper presents a model, a strategy and a methodology for planning integration and regression testing from an object-oriented model. It shows how to produce a model of structural system test dependencies which evolves with the refinement process of the object-oriented design. The model (test dependency graph) serves as a basis for ordering classes and methods to be tested for regression and integration purposes (minimization of test stubs). The mapping from unified modeling language to the defined model is detailed as well as the test methodology. While the complexity of optimal stub minimization is exponential with the size of the model, an algorithm is given that: computes a strategy for integration testing with a quadratic complexity in the worst case; and provides an efficient testing order for minimizing the number of stubs. Various integration strategies are compared with the optimized algorithm (a real-world case study illustrates this comparison). The results of the experiment seem to give nearly optimal stubs with a low cost despite the exponential complexity of getting optimal stubs. As being a part of a design-for-testability approach, the presented methodology also leads to the early repartition of testing resources during system integration for reducing integration duration

Published in:

IEEE Transactions on Reliability  (Volume:49 ,  Issue: 1 )