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Summary form only given. A system for performing accurate measurements of the complex dielectric constant of ceramic materials from 26.5-40 GHz over the -195 to +250/spl deg/C temperature range has been developed. The apparatus is intended primarily to measure the dielectric properties of lossy ceramics used in vacuum electronic devices. The elevated temperature studies are needed to ascertain how the dielectric properties will change over the conditions known to exist in high average power devices, while the low temperature capability is important for understanding the competing mechanisms of dielectric loss in the materials themselves.