Close category search window
 

An immune-based optimization method to capacitor placement in a radial distribution system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Shyh-Jier Huang ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan

An immune algorithm (IA) based optimization approach for solving the capacitor placement problem is proposed in this paper. In the capacitor placement problem, those practical capacitor operating constraints, load profiles, feeder capacities and allowable voltage limits at different load levels are all considered while the investment cost and energy loss are minimized. In the proposed method, objective functions and constraints are represented as antigens. Through the genetic evolution, an antibody that most fits the antigen becomes the solution. In this IA computation, an affinity calculation process is also embedded to guarantee the diversity. The process stagnation can be thus better prevented. The proposed method has been applied to a test system and the results are compared with other published techniques

Published in:
Power Delivery, IEEE Transactions on  (Volume:15 ,  Issue: 2 )

Date of Publication: Apr 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.