Cart (Loading....) | Create Account
Close category search window
 

A low power, low noise, ultra-wide dynamic range CMOS imager with pixel-parallel A/D conversion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Mellrath, L.G. ; MIT, Cambridge, MA, USA

A CMOS image sensor with pixel-parallel A/D conversion fabricated with different array sizes and photodiode types in a 3-metal 0.5 /spl mu/m process is presented. Nominal power dissipation is 40 nW per pixel at V/sub DD/=3.3 V. A/D conversion results from sampling a free-running photocurrent-controlled oscillator to give a first-order /spl Sigma/-/spl Delta/ sequence. The sensor displays dynamic range capability of greater than 150000:1 and exhibits fixed pattern noise correctable to within 0.1% of signal.

Published in:

VLSI Circuits, 2000. Digest of Technical Papers. 2000 Symposium on

Date of Conference:

15-17 June 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.