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Quantitative characterization of substrate noise for physical design guides in digital circuits

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4 Author(s)
Makoto Nagata, ; Fac. of Eng., Hiroshima Univ., Japan ; Jin Nagai ; Morie, T. ; Iwata, A.

Substrate noise is quantitatively evaluated by gain calibrated substrate voltage measurements in a 100 ps-100 μV resolution. Activity in a digital block is a key parameter to which the noise intensity is proportional, and its reduction is a straight and universal solution to suppress the noise. Use of Kelvin grounding in the source circuits and placing a guardband proximate to the receiver circuits together also attenuates the noise significantly, however, the effect is limited to the low frequency components such as ringing

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Custom Integrated Circuits Conference, 2000. CICC. Proceedings of the IEEE 2000

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