Cart (Loading....) | Create Account
Close category search window
 

Physical mechanisms of tissue injury in electrical trauma

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Lee, R.C. ; Dept. of Surgery, Chicago Univ., IL, USA

The author reviews data indicating that skeletal muscle cell rupture may result from either heating or electroporation due to electric shock and discusses their relative contributions to tissue injury in electrical trauma victims. It is concluded that the relative contributions of these mechanisms are probably dependent on the duration of electric current passage, the geometry of the cells, their location, and other factors. If the contact is brief, nonthermal mechanisms of cell damage may be most important. If the contact is much longer, heat damage will be most destructive. The characteristic time before heat damage predominates is probably a function of the electric field strength in the tissue. The various factors involved should also influence the pattern of injury because damage by Joule heating is not known to be dependent on cell size

Published in:

Education, IEEE Transactions on  (Volume:34 ,  Issue: 3 )

Date of Publication:

Aug 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.