By Topic

Temperature controlled oven for low noise measurement systems [for electromigration characterization]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ciofi, C. ; Dipt. di Ingegneria dell''Inf., Pisa Univ., Italy ; Ciofi, I. ; Di Pascoli, S.C. ; Neri, B.

Low-frequency noise (LFN) measurements are often applied to the characterization of electron devices. When such measurements have to be performed on electronic components maintained at a given temperature, the thermal stability of the oven which is used for this purpose becomes a major concern, because of the high sensitivity of electron devices to temperature fluctuations (TF's). In this paper, we present the realization of a high-stability temperature-controlled oven, purposely designed for the characterization of electromigration in metal interconnections of integrated circuits by means of low-frequency noise measurements. The prototype which has been realized demonstrates that the contribution of the thermal fluctuations of the oven to the background noise of the measurement system is negligible down to frequencies as low as 10 mHz in the entire range of operating temperatures (25-250°C)

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:49 ,  Issue: 3 )